Product Name: e/m by Thomson Method
Model No: Texla 1141
Description:

e/m Apparatus consist of C.R.T mounted on a wooden stand, separate stand for Magnets & Magnetometer box and a Power supply to energies with working manual.

Product Name: Laser Diode
Model No: Texla 1143
Description:

Laser Diode 5mw 650nm wavelength with mains operated with inbuilt power supply.

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Product Name: Measurement of Numerical Aperture Kit
Model No: Texla 1144
Description:

To study and determine numerical aperture of the PMMA fiber cables and losses due to the 1 meter and 5 meter cables.

Special Features:

Product Name: Hall Effect Setup
Model No: Texla 1294
Description:

The resistivity measurements of semiconductors can not reveal whether one or two types of carriers are present; nor distinguish between them. However, this information can be obtained from Hall Coefficient measurements, which are also basic tools for the determination of carrier density and mobilities in conjuction with resistivity measurement.

This set up Consist of Hall Probe ( Ge Crystal - n type ) Hall Probe Stand ( Wooden), Hall effect set up Model DHE - 21, Electromagnet Model EMU - 50 V, Constant Current Power Supply DPS - 50 & Digital Gaussmeter Model DGM - 201 Complete in all respect.

Product Name: Malu's Law Apparatus
Model No: Texla 1295
Description:

This Apparatus is used to Verify the Malu's Law of Intensity of Light by using Polarizer, Analyzer fixed on the brass tube with inbuilt solar cell (2v) & a external collimated source of light and a digital Multimeter.

Product Name: Ultrasonic Interferometer
Model No: Texla 1296
Description:

To determine the speed of ultrasonic waves in a non-electrolytic liquid by ultrasonic Interferometer with help of High frequency generator. The principle used in the measurement of velocity (v) is based on the accurate determination of the wavelength (Lambda) in the medium. Ultrasonic waves of known frequency (f) are produced by a quartz crystal fixed at the bottom of the cell.

Product Name: Four Probe Method Apparatus
Model No: Texla 1297
Description:

Resistivity of Semiconductor by Four Probe Method at different temperatures and determination of the Band-gap .The Four Probe Method is one of the standard and most widely used methods for the measurement of resistivity of semiconductors. The experimental arrangement is illustrated. In its useful form, the four probes are collinear. The error due to contact resistance, which is especially serious in the electrical measurement on semiconductors, is avoided by the use of two extra contacts (probes) between the current contacts. In this arrangement the contact resistance may all be high compare to the sample resistance, but as long as the resistance of the sample and contact resistances are small compared with the effective resistance of the voltage measuring device (potentiometer, electrometer or electronic voltmeter), the measured value will remain unaffected. Because of pressure contacts, the arrangement is also especially useful for quick measurement on different samples or sampling different parts of the same sample.

Product Name: B.H Curve Apparatus
Model No: Texla 1298
Description:

B.H Curve with Transformer Core is a trainer kit with built-in power supply with external specimen.

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